נובה בע"מ

Nova’s state-of-the-art metrology solutions are based on multiple advanced technologies in various fields of expertise, including Optical Scatterometry, x-ray photoelectron spectroscopy (XPS), x-ray fluorescence (XRF), Raman, SIMS, Titration, Optical Spectrophotometry, HPLC, CVS, scatterometry modeling software and high-performance computing.

Semiconductor Manufacturers.

Gabriel Waisman - President & CEO

Shay Wolfling - CTO

Guy Kizner - CFO